Blue Room - Session 8

1:00 to 2:00 p.m. Wednesday April 22, 2015

System Reliability Prediction of an Ultrafast Laser

This presentation will focus on a step-by-step process for system reliability prediction availability at the early stage of product development of ultrafast lasers. Practical and theoretical reliability allocation, failure mechanism identification and the burn-in process were addressed to dimension reliability test screening and obtain predictions. This is paramount to meet industrial market demands.

Key Words: Ultrashort Lasers, Reliability, Prediction, MTBF, MTTR, Preventive Maintenance, Failure Elimination

Rysvan Maleck, Romain Saulnier, Rémy Viacroze, Ambre Roubinet and Eric Mottay

Amplitude Systèmes

Laurent Denis