International Applied Reliability Symposium
 

2009

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Track 1 Session 9
8:00 to 9:00 a.m. Friday March 28, 2008

How to Improve “Product Maturity” Using Highly Accelerated Tests

This session will present the Thales Aerospace experience when using Highly Accelerated Tests either during product development in order to improve robustness or during product manufacturing with the goal to precipitate and fix infant failures. The result is a Reliability improvement. Topics discussed will include:

  • HAT and HA-ESS use within Thales
  • How to define, run and analyze highly accelerated tests
  • How to define and validate a screening profile
  • Main difficulties
  • Results and benefits

Key Words: HAT, HALT, HASS, HA-ESS, Aerospace, Weaknesses, Robustness, Reliability

Daniel Goulet
Thales Aerospace Division
France

THALES

 

 

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