International Applied Reliability Symposium: An international reliability conference
 ARS > North America > 2008 Program of Presentations and Tutorials

ARS, North America2008 Program of Presentations and Tutorials

This matrix presents the program of results-oriented presentations and tutorials that will be offered on Tuesday, Wednesday and Thursday, June 17th to 19th, at the 2008 International Applied Reliability Symposium, North America. In addition, attendees have the option to register for a "4 person preferred scramble" Golf Outing on Monday June 16th and the Symposium offers a full day of Research-Oriented Presentations on Friday June 20th.

 A print-ready brochure (*.pdf, 888 KB) is also available.

Tuesday - June 17th Wednesday - June 18th Thursday - June 19th

2008

Track 1 Track 2 Track 3 Track 1 Track 2 Track 3 Track 1 Track 2 Track 3
7:00-8:00 Registration
(coffee and pastries served)
Registration
(coffee and pastries served)
Attendance Certificates Distributed
(coffee and pastries served)
8:00-8:30 Keynote
(in Track 3 Room)

How to Make Reliability Engineering a Cost Competitive Advantage for World Class Quality

Allan Rae
American Axle & Manufacturing (AAM)

T1-S9
Recipe for Successful Reliability Tools

Stan Stephenson
Halliburton

T2-S9
Improve Equipment Failure Rate by Augmenting MIL-HDBK-217 Models with Manufacturer's FIT Data

Simon Ben-David
Raytheon Corporation

T3-S9
Are We As Good As We Need to Be? Requirements and Testing in the Real World

Jacob Stadler
GE Healthcare

8:30-9:00 Welcome
(in Track 3 Room)
9:00-9:10

10 Minute Break

9:10-10:10 T1-S1
Change Point Analysis & DRBFM: A Winning Combination

Lisa Allan
Delphi Thermal Systems

T2-S1
CAE Tools: One of Your Most Valuable Reliability Tools

David Looper
Halliburton

T3-S1
Maintenance Analysis in the Canadian Air Force

Michael Martin
Department of National Defence (Canada)

T1-S5
Program Managing for Reliability During Development of Cessna Citation Mustang

Stefanie Hahn
Cessna Aircraft Company

T2-S5
Exposing Hidden Factory Reliability: Beyond the Plant Information System

Vic Malinasky
Comau, Inc.

T3-S5
RCM and Risk Management

Lynnwood Yates
Andromeda Systems Incorporated

T1-S10
State-of-the-Art Bayesian Reliability Analysis Using WinBUGS

Dana Kelly
Idaho National Laboratory

T2-S10
Design for Reliability in High Volume Spindle Motor Applications

Alexander Parkhomovsky
Seagate Technology

T3-S10
Managing Reliability Success with Vendors on Large Scale Projects

Gary Robine
General Dynamics Land Systems, Inc.

10:10-10:30

20 Minute Break

10:30-11:30 T1-S2
Beyond Theory: The Art and Practical Application of Reliability Growth Modeling to Improve Customer Satisfaction

Bill Lycette
Agilent Technologies

T2-S2
Design for Reliability and Maintainability - A Success Story

Russell W. Morris
The Boeing Company

T3-S2
Application of Risk Management to Medical Devices: Effective Reliability Integration

Kenneth B. Schmidt
OPTIM Associates, Inc.

T1-S6
Reliability Goal Setting: How A Business Decision During Project Scoping Affects Reliability Test Planning

John Holmes
General Electric Consumer & Industrial

T2-S6
Increased Reliability in Small Lot Production Through Use of Fault-Control Methods

Douglas H. Loescher
Sandia National Laboratories

T3-S6
Cost Effective Integrated Failure Analysis Process

Thomas J Misuraca
General Dynamics - Advanced Information Systems

T1-S11
Adventures in Failure Analysis

Dave Darley
GE Healthcare

T2-S11
LCC Solder Joint Reliability in Storage Environments and the Limitations of Modeling Mitigation Methods

Christa Triebwasser
Honeywell

T3-S11
Keeping Field Data Simple (r) – TTR and a Simple Analysis

Jerry Ackaret
IBM

 

 

11:30-1:00

1 Hour 30 Minute Lunch Break

1:00-2:00 T1-S3
Repairable Systems: Data Analysis and Modeling

Adamantios Mettas
ReliaSoft Corporation

T2-S3
Practical Early Reliability and Failures of PCB Solder Joints

David E. Verbitsky
Teletronics Technology Corporation

T3-S3
Product Development - Risk Prediction Methodology

Jerry Young
Hewlett Packard Company

T1-S7
Customer Focused Methodologies for Reliability Testing, Modeling and Failure Analysis in the Semiconductor Laser Diode Industry

Kiran Kuppuswamy
Spectra-Physics

T2-S7
A Method for Quantitatively Predicting the Availability of a Complex Communications Network

Peter K. Zwagerman
Tyco Electronics

T3-S7
Reliability Improvement Program at Philips Healthcare BL Cardio-Vascular

Guillaume Stollman
Philips Healthcare

 T1-S12
Reliability Analysis and Test Planning for Vibration Fatigue Effects in Mechanical and Electromechanical Components

Julio Pulido
Ingersoll Rand

T2-S12
Power of the P-Diagram in Robust Reliability Planning and Execution

Yavuz Goktas
Eaton Corporation

T3-S12
Important Armament Design Characteristics Influencing Reliability and Maintainability

Eric H. Sword
US Army, Armament Research, Development and Engineering Center

2:00-2:20

20 Minute Break

2:20-3:20 T1-S4
Practical Software Failure Analysis

Nematollah Bidokhti
Cisco Systems

T2-S4
The Pitfalls of Accelerated Life Testing

Harland MacKenzie
Dana Corporation

T3-S4
Reliability Centered Maintenance Analysis Facilitation Skills

David J. Auda
AVOX Systems

T1-S8
New Product Dependability Management

Jeremy Bruce
Nortel

T2-S8
Reliability Improvement in Golf Car Development using Applied Reliability Methods

G. Michael Smith
E-Z-GO Textron

T3-S8
Application of Six Sigma Techniques to Overcome Delays in Planned Turnarounds

Wael Salmeen
Kuwait National Petroleum Company

T1-S13
Leadership for Implementation of a Comprehensive DFR-DFSS Program

Dan Denlinger
DED Systems

T2-S13
HALT Methodology Applied for Automotive Components

Rafael Antiquera
Bosch

T3-S13
RM&S Engineering Challenges in the Design of Complex Space Systems

Vladimir Crk
Hamilton Sunstrand

3:20-3:30

10 Minute Break

3:30-5:00 T1-T1
An Introduction to Design for Reliability

Pantelis Vassiliou
ReliaSoft
Corporation

T2-T1
Risk Management: Principles and Applications

Richard B. Jones
HSB Solomon Associates

  T1-T2
Communication is Key: Speak Their Language Using Your Data

Greg Smith
Whirlpool Corporation

T2-T2
Allocating Reliability and Maintainability Downward

Dave Olwell
Naval Postgraduate School

  T1-T3
Taking Design for Six Sigma to the Next Level: New Tools and Methods

Timothy D. Williams
Deere & Co.

T2-T3
Using the Weibull Function to Validate Product Life

Jerry Roslund
GLR Consulting

 
5:00-6:30                  
6:30-9:00

 

 Hosted Awards Dinner 
(for attendee and a guest)

 

The ARS, North America is Organized by ReliaSoft Corporation and the System Reliability Center (SRC).

Copyright © 2003 - 2009 ReliaSoft Corporation. All Rights Reserved.
Privacy Statement | Terms of Use | Contact | About Us